New riskmodel for leaf blotch diseases in wheat

Leaf blotch diseases in wheat, such as Septoria nodorum blotch, Septoria tritici blotch and, tan spot can lead to significant reductions in yield and quality. These diseases survive on plant residues in the soil between growing seasons. Septoria nodorum blotch and tan spot can also be transmitted to seedlings through infected seed.

These fungal diseases are highly climate-dependent, with temperature and humidity playing a crucial role in the development of symptoms and spread in the field. Risk models that predict disease attacks can make it easier to assess the need for fungicides to manage leaf blotch diseases before symptoms appear in the field. The goal is to increase the farmer's financial return on input factors, such as time, energy, fuel and pesticides.

Now, a new risk model for leaf blotch diseases in wheat is available on the VIPS website. NIBIO researcher Dr Andrea Ficke explains that the risk model for leaf blotch diseases was developed based on Norwegian field data collected over 15 years, cross-validated, and included in field trials in 2022 and 2023.

"The accuracy has been very good, and the model is available to advisors and cereal growers through the VIPS website. The model assesses the risk of leaf blotch attacks based on moisture and temperature during tillering and booting stages," she says.

Another risk model from SEGES in Denmark, based solely on hours of high humidity, has been available on VIPS since 2020.

Integrated management of leaf blotch diseases, by using crop rotation, tillage, healthy seeds, less susceptible varieties, and risk models to opitmize fungicide applications, has the potential to increase yields and the return on pesticide and fertilizer input, making farming more sustainable and economically attractive.